Picture of Hall measurement system 5000
Current status:
AVAILABLE
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Responsibles
1st Responsible:
Martins Zubkins
2nd Responsible:
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Description
  • Characterization of various materials including all semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers, oxides, etc.
  • Testing of Temperature vs carrier density, mobility,resistivity, hall coefficient, conductivity, etc.
  • Sample size: 5 mm x 5mm up to 15mm x 15mm,
  • Resistivity: 10-4 to 107 (Ohms-cm),
  • Magnet: Permanent magnet, 30 mm diameter,
  • Magnet Flux Density: 0.55 T nominal ±1% of marked value,
  • Mobility: (cm2/Volt-sec) 1 ~ 107
  • Concentration: (cm-3): 107~ 1021
  • Current Source: Range: 1 nA - 20 mA Compliance: 12 V,
  • Minimum Hall Voltage: 1 μV,
  • Temperature Ranges: 5000: 80K to 350K (only).
Details
Tool name:
Hall measurement system 5000
Area/room:
220
Category:
Characterization
Manufacturer:
Ecopia
Model:
HMS-5000
Tool rate:
A
Instructors & Licensed Users

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Tool Modes
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