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 NameCategoryManufacturerModel
View RIGAKU X-Ray diffractometerCharacterizationRIGAKUMiniFlex 600
View ALD SavannahThin film depositionVeecoSavannah S100
View Differential scanning calorimetry (DSC)/thermal gravimetry (TG)CharacterizationSETARAMLABSYS Evo
View EBL Raith eLINELithographyRaitheLINE Plus
View EDS X-ray anlyzerCharacterizationEDAXEagle III XPL
View EPR SpectrometerSpectroscopyBrukerElexsys-II E500
View FTIR Vertex 80vSpectroscopyBrukerVertex 80v
View Fume hood 114Other processesTerra UniversalDuctless Exhaust Purification Hood
View Fume hood 118Other processesTerra UniversalDuctless Exhaust Purification Hood
View Fume hood 120Other processesTerra UniversalDuctless Exhaust Purification Hood
View Fume hood 414-1Other processesLaborbau Systeme Hemling GmbH & Co. KGTA1800
View Fume hood 414-2Other processesLaborbau Systeme Hemling GmbH & Co. KGTA1800
View Gas sorption analysis systemCharacterizationHy-EnergyLLC PCTPro-2000 with mass spectrometer RGAPro-100
View Glove box 3Other processesMbraunUnilab Pro Eco 3 gloves
View Glove box 4Other processesMbraunUnilab Pro Eco 4 gloves
View Hall measurement system 5000CharacterizationEcopiaHMS-5000
View Ink-Jet Dimatix Materials PrinterThin film depositionFujifilmDimatix Materials Printer DMP-2850
View Lab SupportOther processesISSP ULVirtual
View Laser Ekpsla NL kHzLasersEksplaNL202
View Laser Ekspla NT ns tunableLasersEksplaNT 342/3UV
View Laser Ekspla PL ps tunableLasersEksplaPL 2143A/Pre-T; PG 401/SH; HMPL/TH
View Laser Ekspla SL ps powerfulLasersEksplaSL 312
View Laser excimer EX10ALasersGam Laser, Inc.EX10A
View Laser writer Heidelberg µPGLithographyHeidelberg InstrumentsµPG 101
View LIMS Training Other processesISSP ULCLR
View Mask aligner Suss MA6LithographySuss MicrotecMA/BA6 Gen4
View Mass-spectrometer portableSpectroscopyAmatecDycor LC-D
View Microwave Synthesis System SynthWAVEThermal processesMilestone SrlSynthWAVE T660
View Multifunctional cluster tool SAFThin film depositionSidrabeSAF25/50
View NanoindenterCharacterizationAgilentG200
View Optically detected magnetic resonance spectrometer (ODMR)SpectroscopyOxford InstrumentsSM4000-8
View Particle size analysis equipmentCharacterizationAnton PaarLitesizer 500
View Profiler Dektak 150CharacterizationVeecoDektak 150
View Profiler Zygo 7100CharacterizationZygoNewview 7100
View Raman spectrometerSpectroscopySpectroscopy & imaging GmbHTriVista CRS Confocal Raman Microscope (TR777)
View Sample preparation system for SEMOther processesBuehlerMetaServ 250
View Scanning probe microscope (table top)Electron/Ion microscopyVeecoCP-II
View SEM Phenom ProElectron/Ion microscopyPhenom-WorldPhenom Pro
View SEM/FIB Tescan LyraElectron/Ion microscopyTescanLyra 3
View Spectral ellipsometer Woollam RC2 – XI CharacterizationJ. A. Woollam Co., Inc.RC2 – XI
View Spectrophotometer Cary 7000SpectroscopyAgilentCary 7000 Universal Measurement Spectrophotometer
View Spin coater Laurell WS400LithographyLaurell TechnologiesWS-400B-6 NPP/LITE
View Spin coater Laurell WS650Thin film depositionLaurellWS-650SX-6NPP/LITE
View TEM Fei TecnaiElectron/Ion microscopyFeiTecnai
View Test tool 1CharacterizationISSP ULA
View Test tool 2LithographyISSP ULTest
View Thermogravimetric analyserCharacterizationShimadzu Corp.DTG-60
View XRD X'Pert PROCharacterizationPANalyticalX'Pert Pro Powder
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