Micromechanical characterization of thin films and coatings, nanomaterials and surface layers of bulk materials
- Optimum indentation depth range 100-2000 nm
- Load resolution – 50 nN
- Displacement resolution – <0.01 nm
- Usable sample area –typically up to 32 mm
- CSM (Continuous Stiffness Measurement) option
It is possible to analyze sample batches.