Micromechanical characterization of thin films and coatings, nanomaterials and surface layers of bulk materials

• Optimum indentation depth range 100-2000 nm
• Load resolution – 50 nN
• Displacement resolution – <0.01 nm
• Usable sample area –typically up to 32 mm
• CSM (Continuous Stiffness Measurement) option

It is possible to analyze sample batches.