Picture of Scanning probe microscope (table top)
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Imaging of surfaces using different SPM techniques

  • Scanning area 100x100x7.5 µm
  • Sample size: up to 10×10 mm
  • Scanning by sample
  • Manual XY stage 8×8 mm
  • Motorized Z stage
  • Optical microscope (20x) for tip and sample view

 SPM Techniques:

  • contact mode, tapping mode, force modulation mode
  • scanning tunneling microscopy (STM)
  • magnetic force microscopy (MFM)
  • nanolithography by mechanical scratch
Tool name:
Scanning probe microscope (table top)
Area/room:
317
Category:
Electron/Ion microscopy
Manufacturer:
Veeco
Model:
CP-II
Tool rate:
A
Max booking time, day:
hours
Max booking time, night:
hours
No. of future bookings:

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