Picture of TEM Fei Tecnai
Current status:
DOWN
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Responsibles
1st Responsible:
Krisjanis Smits
2nd Responsible:
Reinis Ignatans
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Description
  • TEM point resolution 0.25 nm, line resolution 0.102 nm
  • Information limit 0.14 nm
  • Schottky field emitter with high maximum beam current (> 100 nA)
  • Energy spread 0.7 eV
  • Flexible high tension (20, 40, 80, 120,160, 200 kV and values in between)
  • Fully computer-controlled, eucentric side-entry
  • High stability CompuStage X, Y movement ± 1 mm, Z movement ± 0.375 mm
  • Specimen size 3 mm
  • EDS, SAED analysis
Details
Tool name:
TEM Fei Tecnai
Area/room:
CLR - 129
Category:
Electron/Ion microscopy
Manufacturer:
Fei
Model:
Tecnai
Tool rate:
C
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Tool Modes
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