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TEM Fei Tecnai (211200)
Current status:
DOWN
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Responsibles
1st Responsible:
Krisjanis Smits
2nd Responsible:
Reinis Ignatans
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Description
TEM point resolution 0.25 nm, line resolution 0.102 nm
Information limit 0.14 nm
Schottky field emitter with high maximum beam current (> 100 nA)
Energy spread 0.7 eV
Flexible high tension (20, 40, 80, 120,160, 200 kV and values in between)
Fully computer-controlled, eucentric side-entry
High stability CompuStage X, Y movement ± 1 mm, Z movement ± 0.375 mm
Specimen size 3 mm
EDS, SAED analysis
Details
Tool name:
TEM Fei Tecnai
Area/room:
CLR - 129
Category:
Electron/Ion microscopy
Manufacturer:
Fei
Model:
Tecnai
Tool rate:
C
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