AFM with Quadrature Phase Differential Interferometry cantilever sensing technology. Operating Modes:

Contact mode,

DART PFM,

Electric force microscopy,

Force curves,

Force mapping mode,

Force modulation,

Frequency modulation,

Kelvin probe force microscopy,

Lateral force mode,

Loss tangent imaging,

Phase imaging,

Piezoresponse force microscopy,

Switching spectroscopy,

Tapping mode,

Vector PFM etc.