High resolution and experimental versatility AFM,

low-noise closed-loop scanner, X&Y range 120 μm, Z range 15 μm.

Operating Modes:

Origin and Origin+ AFM,

Contact Mode,

Bimodal Dual AC,

Dual AC Resonance Tracking,

Electrostatic Force Microscopy,

Force Curve Mode,

Force Modulation,

Frequency Modulation,

Kelvin Probe Force Microscopy,

Lateral Force Mode,

Loss Tangent Imaging,

Magnetic Force Microscopy,

MicroAngelo (nanolithography),

Phase Imaging,

Piezoresponse Force Microscopy,

Switching Spectroscopy ,

Tapping Mode (AC Mode),

Tapping Mode with Q-control,

Vector PFM,

Conductive AFM etc.