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Hall measurement system 5000 (211174)
Current status:
AVAILABLE
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Responsibles
1st Responsible:
Martins Zubkins
2nd Responsible:
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Description
Characterization of various materials including all semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers, oxides, etc.
Testing of Temperature vs carrier density, mobility,resistivity, hall coefficient, conductivity, etc.
Sample size:
5 mm x 5mm up to 15mm x 15mm,
Resistivity:
10
-4
to 10
7
(Ohms-cm),
Magnet:
Permanent magnet, 30 mm diameter,
Magnet Flux Density:
0.55 T nominal ±1% of marked value,
Mobility:
(cm
2
/Volt-sec) 1 ~ 10
7
Concentration:
(cm-3): 10
7
~ 10
21
Current Source:
Range: 1 nA - 20 mA Compliance: 12 V,
Minimum Hall Voltage:
1 μV,
Temperature Ranges:
5000: 80K to 350K (only).
Details
Tool name:
Hall measurement system 5000
Area/room:
220
Category:
Characterization
Manufacturer:
Ecopia
Model:
HMS-5000
Tool rate:
A
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