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AFM Veeco CPII (260327)
Current status:
AVAILABLE
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Responsibles
1st Responsible:
Annamarija Trausa
2nd Responsible:
Krisjanis Smits
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Description
Imaging of surfaces using different SPM techniques
Scanning area 100x100x7.5 µm
Sample size: up to 10×10 mm
Scanning by sample
Manual XY stage 8×8 mm
Motorized Z stage
Optical microscope (20x) for tip and sample view
SPM Techniques:
contact mode, tapping mode, force modulation mode
scanning tunneling microscopy (STM)
magnetic force microscopy (MFM)
nanolithography by mechanical scratch
Details
Tool name:
AFM Veeco CPII
Area/room:
317
Category:
Characterization
Manufacturer:
Veeco
Model:
CP-II
Tool rate:
A
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